TY - JOUR A2 - Buzio，雷纳托AU - 菲拉托夫，梅德AU - Kazantseva，因加AU - 安东诺夫，梅德AU - 安东诺夫，伊万AU - Shenina，玛丽亚AU - 巴甫洛夫，梅德AU - 戈尔什科夫，奥列格PY - 2018 DA - 2018 /07/02 TI - Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles SP - 5489596 VL - 2018 AB - We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage ( 一世 - V ）的CAFM探针对应于所述双极RS接触到所研究的膜表面的曲线，所述负微分电阻（NDR）已观察到的 一世 - V 的AFM探针接触到与金纳米粒子的YSZ膜在导电性（“ON”）的状态的曲线。The NDR has been related to the resonant tunneling of electrons through the size-quantized energy states in the ultrafine (1 to 2 nm in diameter) Au NPs built in the conductive filaments in the YSZ films. SN - 0161-0457 UR - https://doi.org/10.1155/2018/5489596 DO - 10.1155/2018/5489596 JF - Scanning PB - Hindawi KW - ER -